2, Université de Toulon, Toulon, , France
3, IM2NP, CNRS, Marseille, , France
In present synchrotron radiation facilities, the trend towards fast on-the-fly experiments [1,2], made possible in particular thanks to faster low noise hybrid pixel area detectors, opens many avenues for in situ evaluation of structure, strain and defects in various nano-materials. Pole figure measurements can now be performed fast enough to follow intriguing texture changes during phase transformations . Combination of curvature measurements with x-ray diffraction allows for a detailed understanding of strain evolution during crystallization of phase change materials . Thanks to focused beams strain mapping in devices can be performed in situ as a function of temperature . I will also show how small x-ray beams may be used for investigating the mechanical behavior of nano-objects in situ during mechanical testing [6,7]. All these recent evolutions will benefit a lot from the development of new and even more brilliant sources which will appear in the coming years.
 G. Chahine, M.I. Richard, R. Homs et al., J. Appl. Cryst. 47, 762 (2014).
 C. Mocuta, MI. Richard, J. Fouet, S. Stanescu, A. Barbier, C. Guichet, O. Thomas, S. Hustache, A. Zozulya, D. Thiaudiere, J. Appl. Cryst. 46, 1842 (2013).
 MI. Richard, J. Fouet, M. Texier, C. Mocuta, C. Guichet, O. Thomas, Phys. Rev. Lett. 115, 266101 (2015).
 T. Ouled Khachroum, MI. Richard, P. Noe, C.Guichet, C. Mocuta, C. Sabbione, F. Hippert, O. Thomas, Thin Solid Films 617, 44 (2016).
 B. Vianne, MI. Richard, S. Escoubas, S. Labat, T. Schülli, G. Chahine, V. Fiori, O. Thomas, Appl. Phys. Lett. 106, 141905 (2015).
 C. Leclere, T. W. Cornelius, Z. Ren, A. Davydok, J.-S. Micha, O. Robach, G. Richter, L. Belliard and O. Thomas, In situ bending of a Au nanowire monitored by micro Laue diffraction, J. Appl. Cryst. 48, 291 (2015).
 T. Cornelius and O. Thomas, Progress in Materials Science 94, 384-434 (2018).