Key Products: XPS/UPS Equipment; Customized Systems; SPM
SPECS leads the way in state-of-the-art technology, cutting-edge components, and individually designed systems for surface analysis. Our newest solution for environmental XPS is the award-winning EnviroESCA, which features quick sample throughput at Near Ambient Pressure. And for ARPUS, the KREIOS 150, which combines a hemispherical analyzer with a new PEEM lens approach. This allows access to the full photo electron emission hemisphere (±90°). We also offer a variety of sources for deposition, excitation, and charge neutralizers as well as analyzers (the PHOIBOS line), X-Ray sources (μ-focus range), and research microscopes like LEEM and LT-STM (Unisoku portfolio).