Key Products: Analytical Equipment; X-ray Diffraction; SEM Detectors
Bruker’s X-ray Diffraction offers non-destructive characterization of material properties. The D2 PHASER XE-T delivers data quality not possible with other benchtop XRD systems on the market. Bruker also offers a unique range of analysis methods for materials characterization on electron microscopes: EDS, WDS, EBSD and Micro-XRF. Bruker sets standards in performance and functionality in energy-dispersive spectrometry for the scanning electron microscope.
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